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Volumn 13, Issue 1, 2005, Pages 47-63

Three-dimensional inversion of volumetric defects profiles from electromagnetic nondestructive testing signals by means of stochastic methods with the aid of parallel computation

Author keywords

Eddy current testing; Inversion; Non destructive testing; Parallel computing; Volumetric defects

Indexed keywords

ALGORITHMS; COMPUTATIONAL METHODS; EDDY CURRENT TESTING; RANDOM PROCESSES; SIMULATED ANNEALING; THREE DIMENSIONAL; VOLUMETRIC ANALYSIS;

EID: 12344283232     PISSN: 17415977     EISSN: None     Source Type: Journal    
DOI: 10.1080/10682760410001710150     Document Type: Article
Times cited : (9)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.