Rapid prediction of eddy current testing signals using A - φ method and database

NDT and E International

Volumn 32, Issue 1, 1999, Pages 29-36

  Chen, Zhenmao ^a   Miya, Kenzo ^a   Kurokawa, Masaaki ^b  

^a UNIVERSITY OF TOKYO   (Japan)

^b MITSUBISHI HEAVY INDUSTRIES LTD   (Japan)

Author keywords

A method; Database; ECT; Fast scheme; Forward problem

Indexed keywords

CRACKS; DATABASE SYSTEMS; NUMERICAL ANALYSIS; PATTERN RECOGNITION; SIGNAL PROCESSING;

FAST EVALUATION SCHEME;

EDDY CURRENT TESTING;

EID: 0032761994     PISSN: 09638695     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0963-8695(98)00025-5     Document Type: Article

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