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Volumn 20, Issue 1, 2006, Pages 53-68

The effects of stress state, loading frequency and cyclic waveforms on the fatigue behavior of silver-filled electronically-conductive adhesive joints

Author keywords

Crack growth; Cyclic creep; Cyclic frequency; Cyclic loading; Electronically conductive adhesives; Elevated humidity; Elevated temperature; Endurance limit; Fatigue; Fracture; Mode I; Mode III; P N curve; Rate effect; Stress state; Waveform

Indexed keywords

ADHESIVES; CRACK PROPAGATION; CREEP; CYCLIC LOADS; FATIGUE OF MATERIALS; STRESS ANALYSIS; WAVEFORM ANALYSIS; ADHESIVE JOINTS; ELECTRIC CONDUCTIVITY; FRACTURE;

EID: 33645074926     PISSN: 01694243     EISSN: None     Source Type: Journal    
DOI: 10.1163/156856106775212378     Document Type: Article
Times cited : (29)

References (23)
  • 11
    • 0001276746 scopus 로고
    • ASTM STP 674, S. W. Tsai (Ed.), ASTM, Philadelphia, PA
    • C. T. Sun and W. S. Chan, in: Testing and Design, ASTM STP 674, S. W. Tsai (Ed.), p. 418. ASTM, Philadelphia, PA (1979).
    • (1979) Testing and Design , pp. 418
    • Sun, C.T.1    Chan, W.S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.