Quantitative thermal imaging of GalnAsSb/AlGaAsSb laser diodes by thermorefiectaoce

Journal De Physique. IV : JP

Volumn 125, Issue , 2005, Pages 375-378

  Tessier, G ^a   Salhi, A ^b   Rouillard, Y ^b   Genty, F ^b   Roger, J P ^a   Montel, F ^a   Fournier, D ^a  

^a SORBONNE UNIVERSITÉ   (France)

^b UNIVERSITÉ MONTPELLIER II   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; CONTINUOUS WAVE LASERS; LIGHT EMISSION; OPTICAL WAVEGUIDES; SEMICONDUCTOR LASERS;

DAMAGE THRESHOLD; JOULE HEATING; QUASI-STATIC REGIME; THERMOREFLECTANCE SYSTEM;

INFRARED IMAGING;

EID: 33645073965     PISSN: 11554339     EISSN: 17647177     Source Type: Conference Proceeding    
DOI: 10.1051/jp4:2005125087     Document Type: Conference Paper

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