In situ characterization of NiTi based shape memory thin films by optical measurement

Smart Materials and Structures

Volumn 15, Issue 2, 2006, Pages

  Wu, M J ^a   Huang, W M ^a   Chollet, F ^a  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFERENTIAL SCANNING CALORIMETRY; NICKEL COMPOUNDS; PHASE TRANSITIONS; THIN FILMS; TITANIUM COMPOUNDS;

OPTICAL MEASUREMENT; REFLECTION SPECTROMETER; SHAPE MEMORY THIN FILMS;

SHAPE MEMORY EFFECT;

EID: 33645035182     PISSN: 09641726     EISSN: 1361665X     Source Type: Journal    
DOI: 10.1088/0964-1726/15/2/N01     Document Type: Article

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