UNIFIED analytical formulation of thin-film radiative properties including partial coherence

Applied Optics

Volumn 45, Issue 4, 2006, Pages 653-661

  Fu, Kang ^a   Hsu, Pei Feng ^a   Zhang, Zhuomin M ^b  

^a Florida Institute of Technology   (United States)

^b GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE REFLECTION; EQUATIONS OF STATE; FINITE ELEMENT METHOD; NUMERICAL METHODS; OPTICAL PROPERTIES;

OPTICAL COHERENCE THEORY; RADIATIVE PROPERTIES; WAVE OPTICS;

THIN FILMS;

EID: 33645019590     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.45.000653     Document Type: Article

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