Properties of (h 0 0)-oriented La1-xNa xMnO3 films (x=0.1, 0.15 and 0.3) prepared by chemical solution deposition method

Journal of Crystal Growth

Volumn 290, Issue 1, 2006, Pages 180-184

  Dong, Weiwei ^a   Zhu, Xuebin ^b   Tao, Ruhua ^a   Fang, Xiaodong ^a  

^a ANHUI INSTITUTE OF OPTICS AND FINE MECHANICS   (China)

^b INSTITUTE OF SOLID STATE PHYSICS   (China)

Author keywords

A3. Chemical solution deposition; B1. La1 xNa xMnO3; B2. Colossal magnetoresistance

Indexed keywords

CHEMICAL VAPOR DEPOSITION; COLOSSAL MAGNETORESISTANCE; OXIDES; THERMAL EFFECTS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

CHEMICAL SOLUTION DEPOSITION; CURIE TEMPERATURE; LA1-XNAXMNO3; ROOM TEMPERATURE;

LANTHANUM COMPOUNDS;

EID: 33645016399     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2005.12.092     Document Type: Article

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