Complex permittivity and permeability extraction for multilayered samples using S-parameter waveguide measurements

IEEE Transactions on Microwave Theory and Techniques

Volumn 54, Issue 3, 2006, Pages 1201-1208

  Faircloth, Daniel L ^a,b,c,d   Baginski, Michael E ^a,b,d,e,f   Wentworth, Stuart M ^a,b,g  

^a IEEE

^b AUBURN UNIVERSITY   (United States)

^c DYNETICS INC   (United States)

^d Eta Kappa Nu ^*  (United States)

^e AUBURN UNIVERSITY   (United States)

^f NEW YORK ACADEMY OF SCIENCES   (United States)

^g AMERICAN SOCIETY FOR ENGINEERING EDUCATION   (United States)

Author keywords

Permeability extraction; Permittivity extraction; Scattering parameters; Waveguide measurements

Indexed keywords

PERMEABILITY EXTRACTION; PERMITTIVITY EXTRACTION; SHORT-CIRCUIT LINE (SCL); WAVEGUIDE MEASUREMENTS;

ALGORITHMS; MAGNETIC PERMEABILITY; MULTILAYER NEURAL NETWORKS; PERMITTIVITY; QUADRATIC PROGRAMMING; SCATTERING PARAMETERS;

WAVEGUIDES;

EID: 33644972648     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2005.864104     Document Type: Article

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