Depth profile of spin and orbital magnetic moments in a subnanometer Pt film on Co

Physical Review B - Condensed Matter and Materials Physics

Volumn 72, Issue 5, 2005, Pages

  Suzuki, Motohiro ^a   Muraoka, Hiroaki ^b   Inaba, Yuuki ^b   Miyagawa, Hayato ^a   Kawamura, Naomi ^a   Shimatsu, Takehito ^b   Maruyama, Hiroshi ^c   Ishimatsu, Naoki ^c   Isohama, Yoichi ^c   Sonobe, Yoshiaki ^d  

^a SPring 8/JASRI ^*  (Japan)

^b TOHOKU UNIVERSITY   (Japan)

^c HIROSHIMA UNIVERSITY   (Japan)

^d HOYA CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33644933670     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.72.054430     Document Type: Article

References (35)

1. K. Stoev (unpublished).
2. C. P. Bean and J. D. Livingston, J. Appl. Phys. JAPIAU 0021-8979 30, 120S (1959).
3. P.-L. Lu and S. H. Charap, IEEE Trans. Magn. IEMGAQ 0018-9464 10.1109/20.334044 30, 4230 (1994).
4. P. F. Carcia, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.340404 63, 5066 (1988).
5. Y. Sonobe, IEEE Trans. Magn. IEMGAQ 0018-9464 10.1109/TMAG.2002.801810 38, 2006 (2002).
6. S. Rüegg, G. Schütz, P. Fischer, R. Wienke, W. B. Zeper, and H. Ebert, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.347926 69, 5655 (1991).
7. G. Schütz, S. Stähler, M. Knulle, and P. Fischer, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.352622 73, 6430 (1993).
8. H. Nemoto and Y. Hosoe, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1851874 97, 10J109 (2005).
9. H. Maruyama, F. Matsuoka, K. Kobayashi, and H. Yamazaki, J. Magn. Magn. Mater. JMMMDC 0304-8853 140-144, 43 (1995).
10. W. Grange, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.58.6298 58, 6298 (1998).
11. W. Grange, I. Galanakis, M. Alouani, M. Maret, J. P. Kappler, and A. Rogalev, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.62.1157 62, 1157 (2000).
12. Interface alloying becomes significant at ∼600 K (Ref.). The present films were prepared at a much lower temperature such that the interface mixing should be limited.
13. D. Weller, G. R. Harp, R. F. C. Farrow, A. Cebollada, and J. Sticht, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.72.2097 72, 2097 (1994).
14. H. Maruyama, J. Synchrotron Radiat. JSYRES 0909-0495 10.1107/ S0909049599011243 6, 1133 (1999).
15. P. Lechner, Nucl. Instrum. Methods Phys. Res. A NIMAER 0168-9002 10.1016/S0168-9002(00)00872-X 458, 281 (2001).
16. F. Wilhelm, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.85.413 85, 413 (2000).
17. G. Schütz, R. Wienke, W. Wilhelm, W. Wagner, P. Kienle, R. Zeller, and R. Frahm, Z. Phys. B: Condens. Matter ZPCMDN 0722-3277 75, 495 (1989).
18. G. Schütz, R. Wienke, W. Wilhelm, W. B. Zeper, H. Ebert, and K. Spörl, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.344903 67, 4456 (1990).
19. P. Poulopoulos, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1345862 89, 3874 (2001).
20. Y. S. Lee, J. Y. Rhee, C. N. Whang, and Y. P. Lee, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.68.235111 68, 235111 (2003).
21. B. T. Thole, P. Carra, F. Sette, and G. van der Laan, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.68.1943 68, 1943 (1992).
22. P. Carra, B. T. Thole, M. Altarelli, and X. Wang, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.70.694 70, 694 (1993).
23. F. W. Lytle, J. Phys. Chem. JPCHAX 0022-3654 91, 1251 (1987).
24. For removing the edge-jump background, we used a minimum fit parameter to determine an arctan step function. The step width was fixed at 3 eV, which is the convolution of the intrinsic line width (Ref.) and the monochromator band width; the step height was set to the fluorescence yield measured at much beyond the absorption edge; the threshold energy was only the free parameter. After the edge-jump removal using the determined optimum threshold energy, the XAS white line was found to be a Lorentz function of exactly the same energy center and of equivalent width as the corresponding XMCD spectrum. This similarity holds in the region from 11.530 to 11.569 keV for the L3 edge and from 13.240 to 13.276 keV for the L2 edge.
25. D. Weller, J. Stohr, R. Nakajima, A. Carl, M. G. Samant, C. Chappert, R. Megy, P. Beauvillain, P. Veillet, and G. A. Held, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.75.3752 75, 3752 (1995).
26. T. Koide, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.87.257201 87, 257201 (2001).
27. J. Stohr and H. Konig, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.75.3748 75, 3748 (1995).
28. T. Oguchi and T. Shishidou, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.70.024412 70, 024412 (2004).
29. N. W. E. McGee, M. T. Johnson, J. J. de Vries, and J. aan de Stegge, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.352943 73, 3418 (1993).
30. S. Ferrer, J. Alvarez, E. Lundgren, X. Torrelles, P. Fajardo, and F. Boscherini, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.56.9848 56, 9848 (1997).
31. J. Vogel, A. Fontaine, V. Cros, F. Petroff, J.-P. Kappler, G. Krill, A. Rogalev, and J. Goulon, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.55.3663 55, 3663 (1997).
32. The data point for 1
33. S. Okamoto, O. Kitakami, N. Kikuchi, T. Miyazaki, Y. Shimada, and T.-H. Chiang, J. Phys.: Condens. Matter JCOMEL 0953-8984 10.1088/0953-8984/16/12/020 16, 2109 (2004).
34. C. Ederer, M. Komelj, M. Fahnle, and G. Schutz, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.66.094413 66, 094413 (2002).
35. J. Geissler, E. Goering, M. Justen, F. Weigand, G. Schütz, J. Langer, D. Schmitz, H. Maletta, and R. Mattheis, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.65.020405 65, 020405 (R) (2002).