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Volumn 12, Issue 2, 2006, Pages 178-186

Measuring surface topography by scanning electron microscopy. II. Analysis of three estimators of surface roughness in second dimension and third dimension

Author keywords

Dynamic programming; Fractal dimension; SEM; Stereomicroscopy; Surface roughness

Indexed keywords

ARTICLE; CHEMICAL STRUCTURE; ELECTRON PROBE MICROANALYSIS; FRACTAL ANALYSIS; IMAGE PROCESSING; METHODOLOGY; PARTICLE SIZE; REPRODUCIBILITY; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTY;

EID: 33644856029     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S143192760606003X     Document Type: Article
Times cited : (18)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.