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Volumn 503, Issue 1-2, 2006, Pages 45-54
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Aluminum oxide thin dielectric film formation under elevated gravity conditions
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Author keywords
Aluminum oxide; Field emission microscopy; Ultracentrifugation; X ray diffraction
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Indexed keywords
DIELECTRIC FILMS;
FILM PREPARATION;
GRAVITATIONAL EFFECTS;
HYDRATION;
THIN FILMS;
X RAY DIFFRACTION ANALYSIS;
ALUMINUM OXIDE;
CUBICITY;
FIELD EMISSION MICROSCOPY;
ULTRACENTRIFUGATION;
ALUMINA;
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EID: 33644771116
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2005.11.112 Document Type: Article |
Times cited : (12)
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References (35)
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