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Volumn 503, Issue 1-2, 2006, Pages 45-54

Aluminum oxide thin dielectric film formation under elevated gravity conditions

Author keywords

Aluminum oxide; Field emission microscopy; Ultracentrifugation; X ray diffraction

Indexed keywords

DIELECTRIC FILMS; FILM PREPARATION; GRAVITATIONAL EFFECTS; HYDRATION; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

EID: 33644771116     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.11.112     Document Type: Article
Times cited : (12)

References (35)
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    • (1978)
    • Van Der Klooster, H.W.1
  • 25
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    • W. Arnold, Ph.D. Thesis, Clarkson University, 1993.
    • (1993)
    • Arnold, W.1
  • 28
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    • Ph.D. Thesis, Clarkson University
    • R. Derebail, Ph.D. Thesis, Clarkson University, 1994.
    • (1994)
    • Derebail, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.