A microstructural investigation of low-temperature crystalline alumina films grown on aluminum

Thin Solid Films

Volumn 426, Issue 1-2, 2003, Pages 160-171

  Geiculescu, A Corina ^a   Strange, Thomas F ^a  

^a Capacitor Operation   (United States)

Author keywords

Aluminum oxide; Field emission microscopy; Infrared spectroscopy; X ray diffraction

Indexed keywords

ALUMINA; CRYSTALLINE MATERIALS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; HYDRATION; HYDROGEN BONDS; SCANNING ELECTRON MICROSCOPY; THERMODYNAMICS; X RAY DIFFRACTION ANALYSIS;

CRYSTALLINE FILMS;

THIN FILMS;

EID: 0037463303     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(02)01293-2     Document Type: Article

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