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Volumn 260, Issue 1, 2006, Pages 68-72

Phase-crossing algorithm for white-light fringes analysis

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; FOURIER TRANSFORMS; IMAGE SENSORS; OPTICAL RESOLVING POWER;

EID: 33644652557     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2005.10.013     Document Type: Article
Times cited : (32)

References (14)
  • 2
    • 33644645886 scopus 로고
    • Interferometrically measuring the physical properties of test object, United States Patent 4,072,422 (filed October 20 1976, issued February 7)
    • N. Tanaka, M. Takeda, K. Matsumoto, Interferometrically measuring the physical properties of test object, United States Patent 4,072,422 (filed October 20 1976, issued February 7, 1978).
    • (1978)
    • Tanaka, N.1    Takeda, M.2    Matsumoto, K.3
  • 14
    • 15744364608 scopus 로고    scopus 로고
    • A white-light profiling algorithm adopting the multiwavelength interferometric technique
    • K. Creath, J. Schmit (Eds.)
    • H.-C. Hsu, C.-H. Tung, C.-F.Kao, C.C. Chang, A white-light profiling algorithm adopting the multiwavelength interferometric technique, in: K. Creath, J. Schmit (Eds.), Interferometry XII: Technique and Analysis Proc. SPIE, vol. 5531, 2004, p. 244.
    • (2004) Interferometry XII: Technique and Analysis Proc. SPIE , vol.5531 , pp. 244
    • Hsu, H.-C.1    Tung, C.-H.2    Kao, C.-F.3    Chang, C.C.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.