Laser damage threshold of single crystal ZnGeP2 at 2.05 μm

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5991, Issue , 2005, Pages

  Zawilski, Kevin T ^a   Setzler, Scott D ^a   Schunemann, Peter G ^a   Pollak, Thomas M ^a  

^a BAE SYSTEMS   (United States)

Author keywords

Laser damage threshold; Mid infrared materials; Non linear optic materials; Photon backscatter; Single crystal; Surface characterization; Surface roughness; Zinc germanium phosphide

Indexed keywords

INTERFEROMETRY; NONLINEAR OPTICS; SINGLE CRYSTALS; SURFACE ROUGHNESS; ZINC COMPOUNDS;

LASER DAMAGE THRESHOLD; MID-INFRARED MATERIALS; NON-LINEAR OPTIC MATERIALS; SURFACE CHARACTERIZATION; ZINC GERMANIUM PHOSPHIDE;

LASER DAMAGE;

EID: 33644606351     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.638607     Document Type: Conference Paper

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