Nanoscale EELS analysis of oxides: Composition mapping, valence determination and beam damage

Journal of Physics: Conference Series

Volumn 26, Issue 1, 2006, Pages 69-72

  Bentley, J ^a   Gilliss, S R ^b   Carter, C B ^b   Al Sharab, J F ^c   Cosandey, F ^c   Anderson, I M ^a   Kotula, P J ^d  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b University of Minnesota   (United States)

^c RUTGERS UNIVERSITY   (United States)

^d SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33644541755     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/26/1/016     Document Type: Conference Paper

References (9)

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2. Gilliss S R, Bentley J and Carter C B 2005 Appl. Surf. Sci 241 61-7
3. Manoubi T, Colliex C and Rez P 1990 J. Electron Spect. Rel. Phenom 50 1-18
4. Mullins D R, Overbury S H and Huntley D R 1998 Surf. Sci 409 307-19
5. Kundakovic L J, Mullins D R and Overbury S H 2000 Surf. Sci 457 51-62
6. Gilliss S R 2004 PhD dissertation (University of Minnesota)
7. Al-Sharab J F et al J. Am. Ceram. Soc. submitted
8. Bentley J and Anderson I M 1996 Proc. Microscopy and Microanalysis ed G W Bailey et al (San Francisco: San Francisco Press) p 532-3
9. Anderson I M and Bentley J 1997 Mater. Res. Soc. Symp. Proc 458 81-9