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Volumn 234, Issue 1-4, 2004, Pages 403-408

Surface X-ray diffraction in transmission geometry

Author keywords

Reconstructed surface; Silicon; Surface structure; X ray diffraction

Indexed keywords

CRYSTALS; DIFFRACTOMETERS; ERROR DETECTION; IMAGING TECHNIQUES; OPTICAL RESOLVING POWER; RADIATION DETECTORS; SILICON; SYNCHROTRONS; ULTRAHIGH VACUUM; X RAY DIFFRACTION; X RAY SCATTERING;

EID: 3343017481     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.05.025     Document Type: Conference Paper
Times cited : (9)

References (10)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.