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Volumn 234, Issue 1-4, 2004, Pages 403-408
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Surface X-ray diffraction in transmission geometry
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Author keywords
Reconstructed surface; Silicon; Surface structure; X ray diffraction
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Indexed keywords
CRYSTALS;
DIFFRACTOMETERS;
ERROR DETECTION;
IMAGING TECHNIQUES;
OPTICAL RESOLVING POWER;
RADIATION DETECTORS;
SILICON;
SYNCHROTRONS;
ULTRAHIGH VACUUM;
X RAY DIFFRACTION;
X RAY SCATTERING;
RECONSTRUCTED SURFACES;
SPATIAL RESOLUTION;
THERMAL DIFFUSE SCATTERING;
TRANSMISSON GEOMETRY;
SURFACE STRUCTURE;
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EID: 3343017481
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2004.05.025 Document Type: Conference Paper |
Times cited : (9)
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References (10)
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