Surface X-ray diffraction in transmission geometry

Applied Surface Science

Volumn 234, Issue 1-4, 2004, Pages 403-408

  Tajiri, Hiroo ^a   Sakata, Osami ^a   Takahashi, Toshio ^b  

^a JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^b UNIVERSITY OF TOKYO   (Japan)

Author keywords

Reconstructed surface; Silicon; Surface structure; X ray diffraction

Indexed keywords

CRYSTALS; DIFFRACTOMETERS; ERROR DETECTION; IMAGING TECHNIQUES; OPTICAL RESOLVING POWER; RADIATION DETECTORS; SILICON; SYNCHROTRONS; ULTRAHIGH VACUUM; X RAY DIFFRACTION; X RAY SCATTERING;

RECONSTRUCTED SURFACES; SPATIAL RESOLUTION; THERMAL DIFFUSE SCATTERING; TRANSMISSON GEOMETRY;

SURFACE STRUCTURE;

EID: 3343017481     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.05.025     Document Type: Conference Paper

References (10)

1. Lohmeier M., Vlieg E. J. Appl. Cryst. 26:1993;706.
2. Evans-Lutterodt K.W., Tang M.-T. J. Appl. Cryst. 28:1995;318.
3. Takahasi M., Yoneda Y., Inoue H., Yamamoto N., Mizuki J. Jpn. J. Appl. Phys. 41:2002;6247.
4. Feideiihans'l R. Surf. Sci. Rep. 10:1989;105.
5. I.K. Robinson, Handbook on Synchrotron Radiation, vol. 3, Elsevier, North-Holland, Amsterdam, 1991 (Chapter 7).
6. Takahashi T., Nakatani S., Okamoto N., Ishikawa T., Kikuta S. Surf. Sci. 242:1991;54.
7. Sakata O., Furukawa Y., Goto S., Mochizuki T., Uruga T., Takeshita K., Ohashi H., Ohata T., Matsushita T., Takahashi S., Tajiri H., Ishikawa T., Nakamura M., Ito M., Sumitani K., Takahashi T., Shimura T., Saito A., Takahasi M. Surf. Rev. Lett. 10:2003;543.
8. Y. Terada, S. Goto, N. Takimoto, K. Takeshita, H. Yamazaki, Y. Shimizu, S. Takahashi, H. Ohashi, Y. Furukawa, T. Matsushita, T. Ohata, Y. Ishizawa, T. Uruga, H. Kitamura, T. Ishikawa, S. Hayakawa, AIP Conf. Proc. 705 (2004) 376.
9. M. Holt, Z. Wu, Hawoong Hong, P. Zschack, P. Jemian, J. Tischler, Haydn Chen, T.-C. Chiang, Phys. Rev. Lett. 83 (1999) 3317.
10. Robinson I.K. Phys. Rev. B. 33:1986;3830.