Determination of phonon dispersions from x-ray transmission scattering: The example of silicon

Physical Review Letters

Volumn 83, Issue 16, 1999, Pages 3317-3319

  Holt, M ^a   Wu, Z ^a   Hong, Hawoong ^a   Zschack, P ^a   Jemian, P ^a   Tischler, J ^a,b   Chen, Haydn ^a   Chiang, T C ^a  

^a University of Illinois at Urbana Champaign   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000879418     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.83.3317     Document Type: Article

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