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Volumn 466, Issue 1, 2001, Pages 63-73

Comparison of hybrid pixel detectors with Si and GaAs sensors

Author keywords

Active layer; CCE; GaAs; Photon counting; Pixel detector; Silicon; X ray imaging

Indexed keywords

IMAGE ANALYSIS; IMAGE QUALITY; MICROPROCESSOR CHIPS; PHOTONS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING SILICON; SILICON SENSORS; X RAYS;

EID: 0035927790     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(01)00826-9     Document Type: Conference Paper
Times cited : (10)

References (13)
  • 7
    • 0004665068 scopus 로고    scopus 로고
    • National Institute of Standards and Technology, USA
    • (2000)
  • 9
    • 4244183195 scopus 로고    scopus 로고
    • PbSn60 solder bumping by electroplating
    • presented at Pixel 2000, June 5-8, Genova, Italy, submitted for publication
    • (2000) Nucl. Instr. and Meth. A
    • Wolf, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.