A general expression of boundary conditions in TLM diffusion modelling

International Journal of Numerical Modelling: Electronic Networks, Devices and Fields

Volumn 9, Issue 6, 1996, Pages 459-461

  Gui, X ^a,c   Dew, S K ^a   Brett, M J ^a   De Cogan, D ^b  

^a UNIVERSITY OF ALBERTA   (Canada)

^b UNIVERSITY OF EAST ANGLIA   (United Kingdom)

^c UNIVERSITY OF CALGARY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 3342967872     PISSN: 08943370     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1099-1204(199611)9:6<459::aid-jnm262>3.0.co;2-y     Document Type: Article

References (4)

1. X. Gui, S. K. Dew and M. J. Brett, 'TLM treatment of a general diffusion flux boundary condition', Int. J. Numer. Model: Electron. Netw. Devices Fields, 9, 327-333 (1996).
2. M. Y. Al-Zeben, A. H. M. Saleh and M. A. Al-Omar, 'TLM modelling of diffusion, drift and recombination of charge carriers in semiconductors', Int. J. Numer. Model.: Electron. Netw. Devices Fields, 5, 219-225 (1992).
3. P. B. Johns and S. H. Pulko, 'Modelling of heat and mass transfer in foodstuffs', in Food Structure and Behaviour, J. Blanshard and P. Lillford (Eds.), Academic, Orlando, 1987, pp. 199-218.
4. X. Gui, S. K. Dew and M. J. Brett, 'Numerical solution of the electromigration boundary value problem under pulsed dc conditions', J. Appl. Phys., 80, 4948-4951 (1996).