Electrical characterization of Schottky junctions: Anomalies, parameter extraction and barrier height engineering

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3316, Issue 2, 1998, Pages 1085-1092

  Horvath, Zsolt J ^a  

^a INSTITUTE OF EXPERIMENTAL MEDICINE   (Hungary)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC PROPERTIES; SEMICONDUCTOR METAL BOUNDARIES;

BARRIER HEIGHT ENGINEERING; SCHOTTKY JUNCTIONS;

SEMICONDUCTOR JUNCTIONS;

EID: 0032299186     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (103)