Accelerated life test plans robust to misspecification of the stress-life relationship

Technometrics

Volumn 48, Issue 1, 2006, Pages 11-25

  Pascual, Francis G ^a  

^a WASHINGTON STATE UNIVERSITY   (United States)

Author keywords

Asymptotic bias; Asymptotic mean squared error; Asymptotic variance; Maximum likelihood estimation; Optimal test plan; Time failure censoring

Indexed keywords

ASYMPTOTIC BIAS; ASYMPTOTIC MEAN SQUARED ERROR; ASYMPTOTIC VARIANCE; OPTIMAL TEST PLAN; TIME FAILURE CENSORING;

ASYMPTOTIC STABILITY; MATHEMATICAL MODELS; MAXIMUM LIKELIHOOD ESTIMATION; WEIBULL DISTRIBUTION;

PLANNING;

EID: 33344467632     PISSN: 00401706     EISSN: None     Source Type: Trade Journal    
DOI: 10.1198/004017005000000436     Document Type: Article

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