Super-resolution read-only optical disk with different mask materials

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5966, Issue , 2005, Pages

  Wei, Jingsong ^a   Zhang, Feng ^a   Wang, Yang ^a   Gan, Fuxi ^a  

^a SHANGHAI INSTITUTE OF OPTICS AND FINE MECHANICS   (China)

Author keywords

Mask layer; Optical storage; Super resolution

Indexed keywords

MOLECULAR STRUCTURE; OPTICAL RESOLVING POWER; SIGNAL TO NOISE RATIO;

MASK LAYER; STACK STRUCTURES; SUPER-RESOLUTION;

OPTICAL DISK STORAGE;

EID: 33244457996     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.649653     Document Type: Conference Paper

References (6)

1. Jingsong Wei, and Fuxi Gan, "Novel approach to super-resolution pits readout", Opt. Eng. 41, 2073, 2002.
2. Jingsong Wei, Hao Ruan, Hongren Shi, and Fuxi Gan, "Study on read-only optical disk with Sb mask super-resolution", Chin. Sci. Bull. 47, 1604, 2002.
3. Jingsong Wei, Yang Wang, Wendong Xu, et al, "Readout of super-resolution marks with Ti thin film", Chin. Opt. Lett. 1, 420, 2003.
4. Kouichi Yasuda, Masumi Ono, Katsuhisa Aratani, et al, "Premastered optical disk by super-resolution", Jpn. J. Appl. Phys. 32, 5210, 1993
5. Jingsong Wei, Hao Ruan, and Fuxi Gan, "Study on readout of super-resolution pits with Si films", Proc. SPIE 5060, 167, 2003
6. J. E. Moody and R. H. Hendel, "Temperature profile induced by scanning cw laser beam", J. Appl. Phys. 53, 4364, 1982.