Analysis of short-wavelength recording properties of AgInSbTe thin films

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5060, Issue , 2003, Pages 167-170

  Wei, Jingsong ^a   Ruan, Hao ^a   Gan, Fuxi ^a  

^a SHANGHAI INSTITUTE OF OPTICS AND FINE MECHANICS   (China)

Author keywords

Ag5In5Sb47Te33; Recording properties; Short wavelength; Thin films

Indexed keywords

LASER PULSES; LIGHT REFLECTION; MORPHOLOGY; SILVER COMPOUNDS; THIN FILMS;

LASER ENERGY;

OPTICAL RECORDING;

EID: 0041666301     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.510310     Document Type: Conference Paper

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