Effect of substrate temperature on the surface and interface oxidation of NiTi thin films

Journal of Electron Spectroscopy and Related Phenomena

Volumn 151, Issue 2, 2006, Pages 144-148

  Li, Y H ^a   Li, L M ^a   Meng, F L ^b   Zheng, W T ^b   Zhao, J ^b   Wang, Y M ^b  

^a TSINGHUA UNIVERSITY   (China)

^b JILIN UNIVERSITY   (China)

Author keywords

Interface; NiTi thin film; Surface; X ray diffraction; X ray photoelectron spectroscopy

Indexed keywords

ANNEALING; INTERFACES (MATERIALS); NICKEL ALLOYS; OXIDATION; SHAPE MEMORY EFFECT; TITANIUM DIOXIDE; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

INTERFACE OXIDATION; NITI THIN FILMS; SUBSTRATE TEMPERATURE;

THIN FILMS;

EID: 33244456142     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2005.11.009     Document Type: Article

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