Experimental validation of generalized equations for FET cold noise source design

IEEE Transactions on Microwave Theory and Techniques

Volumn 54, Issue 2, 2006, Pages 608-614

  Weatherspoon, Mark H ^a,b,d   Dunleavy, Lawrence P ^a,c,e,f,g  

^a IEEE   (Japan)

^b FAMU FSU COLLEGE OF ENGINEERING   (United States)

^c UNIVERSITY OF SOUTH FLORIDA   (United States)

^d Automatic RF Techniques Group (ARFTG)   (United States)

^e University of South Florida   (United States)

^f USF   (Brazil)

^g Automatic RF Techniques Group

Author keywords

ACL design; Active cold load (ACL); Cold noise source; Cold noise source design; Noise temperature; Noise temperature measurement; Synthetic cold load; Synthetic cold load design; Two port noise source theory

Indexed keywords

ACL DESIGN; ACTIVE COLD LOAD (ACL); COLD NOISE SOURCE; COLD NOISE SOURCE DESIGN; NOISE TEMPERATURE; NOISE TEMPERATURE MEASUREMENT; SYNTHETIC COLD LOAD; SYNTHETIC COLD LOAD DESIGN; TWO-PORT NOISE SOURCE THEORY;

CALIBRATION; COMPUTER SIMULATION; FIELD EFFECT TRANSISTORS; MICROWAVES; RADIOMETERS; SPURIOUS SIGNAL NOISE;

NONLINEAR EQUATIONS;

EID: 33144489579     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2005.862674     Document Type: Article

References (15)

1. R. H. Frater and D. R. Williams, "An active 'cold' noise source," IEEE Trans. Microw. Theory Tech., vol. MTT-29, no. 4, pp. 344-347, Apr. 1981.
2. R. L. Forward and T. C. Cisco, "Electronically cold microwave artificial resistors," IEEE Trans. Microw. Theory Tech., vol. MTT-31, no. 1, pp. 45-50, Jan. 1983.
3. S. M. Lardizabal, "Bias and temperature dependent noise modeling of microwave and millimeter-wave field effect transistors," Ph.D. dissertation, Elect. Eng. Dept., Univ. South Florida, Tampa, FL, 1997.
4. D. Wait and G. F. Engen, "Application of radiometry to the accurate measurement of amplifier noise," IEEE Trans. Instrum. Meas., vol. 40, no. 2, pp. 433-437, Apr. 1991.
5. L. P. Dunleavy, M. C. Smith, S. M. Lardizabal, A. Fejzuli, and R. S. Roeder, "Design and characterization of FET based cold/hot noise sources," in IEEE MTT-S Int. Microw. Symp. Dig., Denver, CO, Jun. 1997, pp. 1293-1296.
6. P. M. Buhles and S. M. Lardizabal, "Design and characterization of MMIC active cold loads," in IEEE MTT-S Int. Microw. Symp. Dig., Boston, MA, Jun. 2000, pp. 29-32.
7. P. Penfield, "Wave representation of amplifier noise," IRE Trans. Circuit Theory, vol. CT-9, pp. 84-86, Mar. 1962.
8. S. W. Wedge and D. B. Rutledge, "Wave techniques for noise modeling and measurement," IEEE Trans. Microw. Theory Tech., vol. 40, no. 11, pp. 2004-2012, Nov. 1992.
9. J. Randa, "Noise parameter uncertainties: Monte Carlo analysis," J. Res. Nat. Inst. Standards Technol., vol. 107, pp. 431-444, Sep.-Oct. 2002.
10. H. Rothe and W. Dahlke, "Theory of noisy four poles," Proc. IRE, vol. 44, no. 6, pp. 811-818, Jun. 1956.
11. R. P. Meys, "A wave approach to noise properties of linear microwave devices," IEEE Trans. Microw. Theory Tech., vol. MTT-26, no. 1, pp. 34-37, Jan. 1978.
12. M. H. Weatherspoon, L. P. Dunleavy, A. Boudiaf, and J. Randa, "Vector corrected noise temperature measurements," in IEEE MTT-S Int. Microw. Symp. Dig., Seattle, WA, May 2002, pp. 2253-2256.
13. M. H. Weatherspoon and L. P. Dunleavy, "Vector corrected on-wafer measurements of noise temperature," IEEE Trans. Instrum. Meas., vol. 54, no. 3, pp. 1327-1332, Jun. 2005.
14. H. A. Haus and R. B. Adler, "Optimum noise performance of linear amplifiers," Proc. IRE, vol. 46, no. 8, pp. 1517-1533, Aug. 1958.
15. J. Engberg, "Simultaneous input power match and noise optimization using feedback," in Proc. 4th Eur. Microw. Conf., Montreux, Switzerland, Sep. 1974, pp. 385-389.