Vector corrected on-wafer measurements of noise temperature

IEEE Transactions on Instrumentation and Measurement

Volumn 54, Issue 3, 2005, Pages 1327-1332

  Weatherspoon, Mark H ^a   Dunleavy, Lawrence P ^b  

^a FAMU FSU COLLEGE OF ENGINEERING   (United States)

^b University of South Florida   (United States)

Author keywords

Active cold load; Mismatch error; Noise; Noise parameters; Noise temperature; Noise temperature measurement; Noise temperature measurement errors; Radiometer

Indexed keywords

DIODES; ERROR CORRECTION; MEASUREMENT ERRORS; MONOLITHIC MICROWAVE INTEGRATED CIRCUITS; OPTIMIZATION; RADIOMETERS; SIGNAL RECEIVERS; SOLID STATE DEVICES; SPURIOUS SIGNAL NOISE; VECTORS;

ACTIVE COLD LOAD; MISMATCH ERROR; NOISE PARAMETERS; NOISE TEMPERATURE; NOISE TEMPERATURE MEASUREMENT; NOISE TEMPERATURE MEASUREMENT ERRORS; SOLID STATE DIODES;

TEMPERATURE MEASUREMENT;

EID: 20544472673     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2005.847218     Document Type: Article

References (14)

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