Vector corrected noise temperature measurements

IEEE MTT-S International Microwave Symposium Digest

Volumn 3, Issue , 2002, Pages 2253-2256

  Weatherspoon, Mark H ^a   Dunleavy, Lawrence P ^a   Boudiaf, Ali ^b   Randa, James ^c  

^a University of South Florida   (United States)

^b AGILENT TECHNOLOGIES   (United States)

^c NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Enhanced scalar method; Mismatch error; Noise; Noise parameters; Noise temperature; Noise temperature measurement; Noise temperature measurement errors; Radiometer method; Scalar method; Vector method

Indexed keywords

DIODES; ERROR CORRECTION; IMPEDANCE MATCHING (ELECTRIC); MEASUREMENT ERRORS; RADIOMETRY; SIGNAL RECEIVERS; SOLID STATE DEVICES; TEMPERATURE MEASUREMENT; VECTORS;

NOISE PARAMETERS; NOISE TEMPERATURE; SOLID STATE NOISE DIODES;

SPURIOUS SIGNAL NOISE;

EID: 0036066050     PISSN: 0149645X     EISSN: None     Source Type: Journal    
DOI: 10.1109/MWSYM.2002.1012322     Document Type: Article

References (7)

1. Uncertainties in NIST noise temperature measurements
2. Enhanced one-port noise temperature measurements using a noise figure meter
3. Design and characterization of FET based cold/hot noise sources
4. ATN microwave
5. Modeling of noise parameters of MESFET's and MODFET's and their frequency and temperature dependence
6. Direct extraction of all four transistor noise parameters from a single noise figure measurement
7. An active "Cold" noise source