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Volumn 17, Issue 5, 2006, Pages 1391-1396

Dissection and high-yield recovery of nanometre-scale chromosome fragments using an atomic-force microscope

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; NANOSTRUCTURED MATERIALS; SILICON;

EID: 33144464296     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/17/5/038     Document Type: Article
Times cited : (9)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.