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Volumn 17, Issue 5, 2006, Pages 1391-1396
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Dissection and high-yield recovery of nanometre-scale chromosome fragments using an atomic-force microscope
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
NANOSTRUCTURED MATERIALS;
SILICON;
BIOLOGICAL BUFFER;
CANTILEVER CONTROL;
CHROMOSOMES;
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EID: 33144464296
PISSN: 09574484
EISSN: None
Source Type: Journal
DOI: 10.1088/0957-4484/17/5/038 Document Type: Article |
Times cited : (9)
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References (15)
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