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Volumn PART A, Issue , 2005, Pages 511-516

Thermal interface material technology advancements and challenges - An overview

Author keywords

[No Author keywords available]

Indexed keywords

FLIP CHIP DEVICES; HEAT LOSSES; MICROPROCESSOR CHIPS; SERVERS; TRANSISTORS;

EID: 32844472118     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1115/ipack2005-73384     Document Type: Conference Paper
Times cited : (6)

References (5)
  • 2
    • 0034822788 scopus 로고    scopus 로고
    • An accelerated reliability test method to predict thermal grease pump-out in flip chip applications
    • C. P. Chiu, B. Chandran, M. Mello, K. Kelley, 'An accelerated Reliability Test Method to Predict Thermal Grease Pump-out in Flip Chip Applications', ECTC, 2001
    • (2001) ECTC
    • Chiu, C.P.1    Chandran, B.2    Mello, M.3    Kelley, K.4
  • 4
    • 84858544275 scopus 로고    scopus 로고
    • 'Gel TIM comprising fillers having low melting point and electronic packages having these Gel TIM", Intel Patent 6,841,867, Jan
    • J. C. Matayabas Jr., A. Dani. P. Koning, C. Rumer, 'Gel TIM comprising fillers having low melting point and electronic packages having these Gel TIM", Intel Patent 6,841,867, Jan, 2005.
    • (2005)
    • Matayabas Jr., J.C.1    Dani, A.2    Koning, P.3    Rumer, C.4
  • 5
    • 84858547797 scopus 로고    scopus 로고
    • 'An Electronic Assembly having solder thermal interface between die, substrate and a heat spreader", Intel Patents 6,817,091 and 6, 504, 723
    • C. Deppisch, S. Houle, 'An Electronic Assembly having solder thermal interface between die, substrate and a heat spreader", Intel Patents 6,817,091 and 6, 504, 723
    • Deppisch, C.1    Houle, S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.