SCOPUS 정보 검색 플랫폼

Volumn 96, Issue 3, 2006, Pages

X-Ray tomographic imaging of crystal structure at the atomic level

b DESY (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; CARRIER CONCENTRATION; SEMICONDUCTING GALLIUM COMPOUNDS; TOMOGRAPHY; X RAY ANALYSIS;

ELECTRON DENSITY DISTRIBUTION; NONDIFFRACTIVE TOMOGRAPHIC ALGORITHM;

CRYSTAL STRUCTURE;

EID: 32644487581 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.96.035502 Document Type: Article

Times cited : (13)

References (18)

1
- 0003545679
- North-Holland, Amsterdam
- J.M. Cowley, Diffraction Physics (North-Holland, Amsterdam, 1975).
- (1975) Diffraction Physics
- Cowley, J.M.¹

2
- 0004223717
- edited by G. Materlik, C.J. Sparks, and K. Fischer (North-Holland, Amsterdam
- Resonant Anomalous X-Ray Scattering, edited by, G. Materlik, C.J. Sparks, and, K. Fischer, (North-Holland, Amsterdam, 1994).
- (1994) Resonant Anomalous X-Ray Scattering

3
- 0000184916
- ACACEQ 0108-7673 10.1107/S0108767396011117
- E. Weckert and K. Hummer, Acta Crystallogr. Sect. A ACACEQ 0108-7673 53, 108 (1997). 10.1107/S0108767396011117
- (1997) Acta Crystallogr. Sect. A , vol.53 , pp. 108
- Weckert, E.¹ Hummer, K.²

4
- 0000168583
- PRBMDO 0163-1829 10.1103/PhysRevB.32.6456
- M.J. Bedzyk and G. Materlik, Phys. Rev. B PRBMDO 0163-1829 32, 6456 (1985). 10.1103/PhysRevB.32.6456
- (1985) Phys. Rev. B , vol.32 , pp. 6456
- Bedzyk, M.J.¹ Materlik, G.²

5
- 0029728941
- NATUAS 0028-0836 10.1038/380049a0
- M. Tegze and G. Faigel, Nature (London) 380, 49 (1996). NATUAS 0028-0836 10.1038/380049a0
- (1996) Nature (London) , vol.380 , pp. 49
- Tegze, M.¹ Faigel, G.²

6
- 0001754551
- PRLTAO 0031-9007 10.1103/PhysRevLett.76.3132
- T. Gog, Phys. Rev. Lett. 76, 3132 (1996). PRLTAO 0031-9007 10.1103/PhysRevLett.76.3132
- (1996) Phys. Rev. Lett. , vol.76 , pp. 3132
- Gog, T.¹

7
- 0042768638
- PRLTAO 0031-9007 10.1103/PhysRevLett.90.255503
- L. Cheng, Phys. Rev. Lett. 90, 255503 (2003). PRLTAO 0031-9007 10.1103/PhysRevLett.90.255503
- (2003) Phys. Rev. Lett. , vol.90 , pp. 255503
- Cheng, L.¹

8
- 35949008207
- PRLTAO 0031-9007 10.1103/PhysRevLett.61.1356
- J.J. Barton, Phys. Rev. Lett. 61, 1356 (1988). PRLTAO 0031-9007 10.1103/PhysRevLett.61.1356
- (1988) Phys. Rev. Lett. , vol.61 , pp. 1356
- Barton, J.J.¹

9
- 0035848223
- PRLTAO 0031-9007 10.1103/PhysRevLett.86.2333
- P. Korecki and G. Materlik, Phys. Rev. Lett. 86, 2333 (2001). PRLTAO 0031-9007 10.1103/PhysRevLett.86.2333
- (2001) Phys. Rev. Lett. , vol.86 , pp. 2333
- Korecki, P.¹ Materlik, G.²

10
- 0000730726
- PRBMDO 0163-1829 10.1103/PhysRevB.57.7526
- B. Adams, Phys. Rev. B PRBMDO 0163-1829 57, 7526 (1998). 10.1103/PhysRevB.57.7526
- (1998) Phys. Rev. B , vol.57 , pp. 7526
- Adams, B.¹

11
- 0003735899
- IEEE Press, New York
- A.C. Kak and M. Slaney, Principles of Computerized Tomographic Imaging (IEEE Press, New York, 1988).
- (1988) Principles of Computerized Tomographic Imaging
- Kak, A.C.¹ Slaney, M.²

12
- 0642323824
- North-Holland, Amsterdam
- R.P. Porter, Progress in Optics (North-Holland, Amsterdam, 1989), Vol. XXVII, p. 317.
- (1989) Progress in Optics , vol.27 , pp. 317
- Porter, R.P.¹

13
- 0028498513
- SUSCAS 0039-6028 10.1016/0039-6028(94)91124-X
- J. Rous and M.H. Rubin, Surf. Sci. 316, L1068 (1994). SUSCAS 0039-6028 10.1016/0039-6028(94)91124-X
- (1994) Surf. Sci. , vol.316 , pp. 1068
- Rous, J.¹ Rubin, M.H.²

14
- 0004230519
- Wiley, Chichester
- F. Natterer, The Mathematics of Computerized Tomography (Wiley, Chichester, 1986).
- (1986) The Mathematics of Computerized Tomography
- Natterer, F.¹

15
- 9644277423
- PRBMDO 0163-1829 10.1103/PhysRevB.66.094111
- S. Marchesini, Phys. Rev. B PRBMDO 0163-1829 66, 094111 (2002). 10.1103/PhysRevB.66.094111
- (2002) Phys. Rev. B , vol.66 , pp. 094111
- Marchesini, S.¹

16
- 42749109021
- PRBMDO 0163-1829 10.1103/PhysRevB.69.184103
- P. Korecki, Phys. Rev. B PRBMDO 0163-1829 69, 184103 (2004). 10.1103/PhysRevB.69.184103
- (2004) Phys. Rev. B , vol.69 , pp. 184103
- Korecki, P.¹

17
- 84892340887
- Springer, Berlin
- B. Fultz and J.M. Howe, Transmission Electron Microscopy and Diffractometry of Materials (Springer, Berlin, 2002).
- (2002) Transmission Electron Microscopy and Diffractometry of Materials
- Fultz, B.¹ Howe, J.M.²

18
- 0001166394
- PRBMDO 0163-1829 10.1103/PhysRevB.44.13764
- J. Osterwalder, Phys. Rev. B PRBMDO 0163-1829 44, 13764 (1991). 10.1103/PhysRevB.44.13764
- (1991) Phys. Rev. B , vol.44 , pp. 13764
- Osterwalder, J.¹

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