Surface analysis for LiBq 4 growing on ITO and CuPc film using atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS)

Applied Surface Science

Volumn 252, Issue 10, 2006, Pages 3417-3427

  Ou, Gu Ping ^a   Gui, Wen Ming ^a   Jin, Shi Chao ^a   Zhang, Fu Jia ^a  

^a LANZHOU UNIVERSITY   (China)

Author keywords

Atomic force microscopy (AFM); Electron affinity; X ray photoelectron spectroscopy (XPS)

Indexed keywords

ATOMIC FORCE MICROSCOPY; CONTAMINATION; COPPER COMPOUNDS; INDIUM COMPOUNDS; LITHIUM COMPOUNDS; MORPHOLOGY; OXIDATION; THERMODYNAMIC STABILITY; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

ELECTRON AFFINITY; FILM QUALITY;

SURFACE STRUCTURE;

EID: 32644451434     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2005.01.042     Document Type: Article

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