Surface and interface analysis for copper phthalocyanine (CuPc) and indium-tin-oxide (ITO) using X-ray photoelectron spectroscopy (XPS)

Applied Surface Science

Volumn 211, Issue 1-4, 2003, Pages 24-30

  Zheng, Daishun ^a   Gao, Zhaoyang ^a   He, Xiyuan ^a   Zhang, Fujia ^a   Liu, Liming ^b  

^a LANZHOU UNIVERSITY   (China)

^b INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

Author keywords

OLEDs; Surface and interface analysis; X ray photoelectron spectroscopy (XPS)

Indexed keywords

ELECTRODES; ELECTRON ENERGY LEVELS; EVAPORATION; HOLE MOBILITY; INDIUM COMPOUNDS; LIGHT EMITTING DIODES; SEMICONDUCTING ORGANIC COMPOUNDS; SURFACE CHEMISTRY; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

INTERFACE ANALYSIS; THERMAL EVAPORATION;

COPPER COMPOUNDS;

EID: 0038333232     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)01333-8     Document Type: Article

References (29)

1. Tang C.W., Van Slyke S.A. Appl. Phys. Lett. 51:1987;913.
2. Mathine D.L., Woo H.S., He W., Kim T.W., Kippelen B., Peyghambarian N. Appl. Phys. Lett. 76:2000;3849.
3. Braun D., Heeger A.J. Appl. Phys. Lett. 58:1991;1982.
4. Kim J.S., Cacialli F., Cola A., Gigli G., Cingolani R. Appl. Phys. Lett. 75:1999;19.
5. Zhang Z., Jiang X., Xu S. Thin Solid Films. 363:2000;61.
6. Pyo S.W., Lee S.P., Lee H.S., Kwon O.K., Hoe H.S., Lee S.H., Ha Y.-K., Kim Y.K., Kim J.S. Thin Solid Films. 363:2000;232.
7. Hosokawa C., Higashi H., Nakamura H., Kusumoto T. Appl. Phys. Lett. 67:1995;3853.
8. Van Slyke S.A., Chen C.H., Tang C.W. Appl. Phys. Lett. 69:1996;2160.
9. Wakimoto T., Fukuda Y., Nagayama K., Yokoi A., Nakada H., Tsuchida M. IEEE Trans. Electron. Devices. 44:1997;1245.
10. Shi J., Tang C.W. Appl. Phys. Lett. 70:1997;1665.
11. Choong V.-E., Shi S., Curless J., Shieh C.-L., Lee H.-C., So F., Shen J., Yang J. Appl. Phys. Lett. 75:1999;172.
12. Yu W.-L., Cao Y., Pei J., Huang W., Heeger A.J. Appl. Phys. Lett. 75:1999;3270.
13. Choong V.-E., Shi S., Curless J., So F. Appl. Phys. Lett. 76:2000;958.
14. Wu F., Tian W., Zhang Z., Ma Y., Li G., Shen J., Zhang L., Zhang B., Cao Y. Thin Solid Films. 363:2000;214.
15. Jiang X., Zhang Z., Zhao W., Zhu W., Zhang B., Xu S. J. Phys. D: Appl. Phys. 33:2000;473.
16. Kim S.C., Lee G.B., Choi M.-W., Roh Y., Whang C.N., Jeong K., Lee J.-G., Kim S. Appl. Phys. Lett. 78:2001;1445.
17. Jiang H., Zhou Y., Ooi B.S., Chen Y., Wee T., Lam Y.L., Huang J., Liu S. Thin Solid Films. 363:2000;25.
18. Szuber J., Grzadziel L. Thin Solid Films. 391:2001;282.
19. Scott J.C., Kaufman J.H., Brock P.J., DiPertro R., Salem J., Gotia J.A. J. Appl. Phys. 79:1996;2745.
20. Nuesch F., Carrara M., Schaer M., Romero D.B., Zuppiroli L. Chem. Phys. Lett. 347:2001;311.
21. Wu C.C., Wu C.I., Sturm J.C., Kahn A. Appl. Phys. Lett. 70:1997;1348.
22. Marsh J., Minel L., Barthes-Labrousse M.G., Gorse D. Appl. Surf. Sci. 133:1998;270.
23. Watts J.F., Castle J.E. J. Mater. Sci. 19:1984;2259.
24. Le Q.T., Avenda F.M., Forsythe E.M., Yan L., Gao Y., Tang C.W. J. Vac. Sci. Technol. A17(4):1999;2314.
25. Adolphi B., Berger O., Fischer W.-J. Appl. Surf. Sci. 179:2001;102.
26. C.D. Wagner, Handbook of X-ray and Ultra-violet Photoelectron Spectroscopy, Heyden, London, 1977 (Chapter 7).
27. Clark D.T., Fok T., Roberts G.G., Sykes R.W. Thin Solid Films. 70:1980;261.
28. Ansell R.O., Dickinson T., Povey A.F., Sherwood P.M.A. J. Electron. Spectrosc. Relat. Phenom. 11:1977;301.
29. Wang Y.Z., Jiang C.G. Chin. J. Semicond. 7(6):1986;596.