Filters, mirrors and microcavities from porous silicon

International Journal of Modern Physics B

Volumn 20, Issue 1, 2006, Pages 99-110

  Agarwal, V ^a   Del Rio J A ^b  

^a UNIVERSIDAD AUTÓNOMA DEL ESTADO DE MORELOS   (Mexico)

^b INSTITUTO DE ENERGÍAS RENOVABLES   (Mexico)

Author keywords

Bragg reflector; Dielectric filters; Microcavities; Mirrors; Multilayers; Porous silicon

Indexed keywords

EID: 32644444036     PISSN: 02179792     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0217979206033115     Document Type: Article

References (16)

1. L. T. Canham, Appl. Phys. Lett. 57, 1046 (1990).
2. M. V. Wolkin, S. Chan and P. M. Fauchet, Phys. Status Solidi A 182, 573 (2000).
3. H. A. Lopez and P. M. Fauchet, Mater. Sci. and Eng. B 81, 91 (2001).
4. M. Ghullinyan, C. J. Oton, Z. Gaburro, P. Bettotti and L. Pavesi, Appl. Phys. Lett. 82, 1550 (2003).
5. V. Agarwal, J. A. del Río, G. M. Zamfirescu, A. Kavokin, D. Coquillat, D. Scalbert, M. Vladimirova and B. Gil, Phys. Rev. Lett. 92, 097401 (2004).
6. R. Sapienza, P. Costantino, D. Wiersma, M. Ghulinyan, C. J. Oton and L. Pavesi, Phys. Rev. Lett. 91, 263902 (2003).
7. L. Pavesi, J. Phys.: Condens. Matter 15, R1169 (2003).
8. W. Theiss and S. Hilbrich, EMIS datareviews series, Properties of Porous Silicon, ed. L. T. Canham, (INSPEC/IEE, London, 1998), pg. 223.
9. S. Chan and P. M. Fauchet, Appl. Phys. Lett. 75, 274 (1999).
10. V. Agarwal, Y. Rubo and J. A. del Río, Phys. Status Solidi A 197, 345 (2003).
11. J. E. Lugo, J. A. del Río and J. Tagüeña, J. Appl. Phys. 81, 1923 (1997).
12. D. E. Gray (ed.), American Institute of Physics Handbook (AIP Melville, New York, 1972), p. 6.
13. L. Pavesi, G. Panzarini and L. C. Andraeni, Phys. Rev. B 58, 15794 (1998).
14. M. Servidori, C. Ferrero, S. Lequien et al., Sol. State Commun. 118, 85 (2001).
15. S. Billat, M. Thonissen, R. Arens-Fischer, M. B. Berger, M. Kruger and H. Luth, Thin Solid Films 297, 22 (1997).
16. G. Malpuech, A. Kavokin, G. Panzarini and A. Di Carlo, 63, 035108 (2001).