Porous silicon free-standing coupled microcavities

Applied Physics Letters

Volumn 82, Issue 10, 2003, Pages 1550-1552

  Ghulinyan, M ^a   Oton, C J ^a   Gaburro, Z ^a   Bettotti, P ^a   Pavesi, L ^a  

^a UNIVERSITY OF TRENTO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ETCHING; MICROELECTRONICS; POROSITY; REFRACTIVE INDEX; SUBSTRATES;

COUPLED MICROCAVITIES (CMC);

POROUS SILICON;

EID: 0037429888     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1559949     Document Type: Article

References (10)

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10. Measurements with very small spot size yield much narrower resonances, down to 1-2 nm of full width at half maximum.