Microsecond minority carrier lifetimes in HWCVD-grown films and implications for thin film solar cells

Thin Solid Films

Volumn 501, Issue 1-2, 2006, Pages 288-290

  Mason, M S ^a   Richardson, C E ^a   Atwater, H A ^a   Ahrenkiel, R K ^b  

^a California Institute of Technology   (United States)

^b NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

Hot wire deposition; Photoconductive decay; Photovoltaics; Silicon

Indexed keywords

NICKEL; POLYCRYSTALLINE MATERIALS; SILICON; SOLAR CELLS;

HOT-WIRE DEPOSITION; PHOTOCONDUCTIVE DECAY;

THIN FILMS;

EID: 32644443715     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.07.197     Document Type: Conference Paper

References (6)

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2. M.S. Mason. PhD thesis, California Institute of Technology, 2004.
3. C.E. Richardson, M.S. Mason, H.A. Atwater, 3rd International Conference on Hot-Wire CVD, Abstract # HW3-81.
4. J.K. Rath, A. Barbon, and R.E.I. Schropp J. Non-Cryst. Solids 227 1998 1277
5. R.K. Ahrenkiel, and S. Johnston Surf. Eng. 16 2000 54
6. B. Stannowski, J.K. Rath, and R.E.I. Schropp Thin Solid Films 430 2003 220