Feasibility of static secondary ion mass spectrometry to study physicochemical interactions between organic components and silver in thermographic systems

Rapid Communications in Mass Spectrometry

Volumn 20, Issue 4, 2006, Pages 641-652

  De Mondt, Roel ^a   Van Vaeck, Luc ^a   Lenaerts, Jens ^b   Geuens, Ingrid ^b   Van Luppen, Jaymes ^b  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b AGFA GEVAERT N V   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY; SILICON WAFERS; SILVER;

ACTIVE COMPOUNDS; AG +; COMPLEX MATERIALS; HIGH-TECHNOLOGY PRODUCTS; INTERMOLECULAR INTERACTIONS; ORGANIC COMPONENTS; PHYSICO-CHEMICAL INTERACTIONS; PHYSICOCHEMICAL BEHAVIORS; SIGNAL INTENSITIES; STATIC SECONDARY ION MASS SPECTROMETRIES;

IONS;

EID: 32544449793     PISSN: 09514198     EISSN: 10970231     Source Type: Journal    
DOI: 10.1002/rcm.2357     Document Type: Article

References (27)

1. Lenaerts J, Verlinden G, Van Vaeck L, Gijbels R, Geuens I, Gallant P. Langmuir 2001; 17: 7332.
2. Van Vaeck L, Adriaens A, Gijbels R. Mass Spectrom. Rev. 1999; 18: 1.
3. Vickerman JC, Briggs D (eds). TOF-SIMS: Surface Analysis by Mass Spectrometry, SurfaceSpectra Ltd/IM Publications: Manchester, 2001.
4. Van Vaeck L, Adriaens A, Gijbels R. Mass Spectrom. Rev. 1999; 18: 48.
5. Geuens I, Vanwelkenhuysen I. J. Imag. Sci. Technol. 1999; 43: 521.
6. European Patent EP848286: Thermographic recording material with improved image tone and/or stability upon thermal development.
7. Benninghoven A, Rüdenauer FG, Werner HW. Secondary Ion Mass Spectrometry, Chemical Analysis, vol. 86. John Wiley: New York, 1987; 7-276.
8. Benninghoven A. Ion Formation from Organic Solids (IFOS II), Springer Series in Chemical Physics 25, Benninghoven A (ed). Springer: New York, 1983; 64-89.
9. Cooks RG, Busch KL. Int. J. Mass Spectrom. Ion Phys. 1983; 53: 111.
10. Garrison BJ, Delcorte A, Zhigilei LV, Itina TE, Krantzman KD, Yingling YG, McQuaw CM, Smiley EJ, Winograd N. Appl. Surface Sci. 2003; 203/204: 69.
11. Muramoto T, Yamamura Y. Appl. Surface Sci. 2003; 203/204: 143.
12. Krantzman KD, Postawa Z, Garrison BJ, Winograd N, Stuart SJ, Harrison JA. Nucl. Instrum. Methods Phys. Res. B 2001; 180: 159.
13. Garrison BJ. Molecular dynamics simulations, the theoretical partner to static SIMS experiments. In TOF-SIMS: Surface Analysis by Mass Spectrometry, Vickerman JC, Briggs D (eds). SurfaceSpectra Ltd/IM Publications: Manchester, 2001; 223-257.
14. Harper S, Krantzman KD. Appl. Surface Sci. 2004, 231/232: 44.
15. Van Vaeck L, Claereboudt J, De Waele J, Esmans E, Gijbels R. Anal. Chem. 1985; 57: 2944.
16. Van Vaeck L, Struyf H, Van Roy W, Adams F. Mass Spectrom. Rev. 1994; 13: 189.
17. Van Ham R, Van Vaeck L, Adriaens A, Adams F. Anal. Chim. Acta 2003; 500: 259.
18. Van Ham R. Molecular speciation using static secondary ion mass spectrometry: methodology and applications, PhD thesis, UA, 2002; 48-53.
19. Lenaerts J. Methodology development for organic surface analysis: evaluation of mass spectrometric behaviour and imaging capabilities in TOF-SIMS, PhD thesis, UA, 2003; 111-139.
20. Lenaerts J, Van Vaeck L, Gijbels R. Rapid Commun. Mass Spectrom. 2003; 17: 2115.
21. Van Royen P, Taranu A, Van Vaeck L. Rapid Commun. Mass Spectrom. 2005; 19: 552.
22. Van Ham R, Van Vaeck L, Adams FC, Adriaens A. Anal. Chem. 2004; 76: 2609.
23. Franey TP, Kammlott GW, Graedel TE. Corros. Sci. 1985; 25: 133.
24. van Leyen D, Hagenhoff B, Niehuis E, Benninghoven A, Bletsos IV, Hercules DM. J. Vac. Sci. Technol. A 1989; 7: 1790.
25. Rouquerol F, Rouquerol J, Sing K. Adsorption by Powders and Porous Solids, Academic Press: London, 1999; 10.
26. Hagenhoff B, Benninghoven A, Spinke J, Liley M, Knoll W. Langmuir 1993; 9: 1622.
27. van Beulen MWJ, Huisman B-H, van der Heijden PA, van Eggel FCJM, Simons MG, Biemond EMEF, de Lange PJ, Reinhoudt DN. Langmuir 1996; 12: 6170.