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Volumn 37, Issue 4, 2006, Pages 290-294
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Modeling and gradient pattern analysis of irregular SFM structures of porous silicon
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Author keywords
Gradient pattern analysis; KPZ equation; Nanostructures; Porous silicon
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Indexed keywords
IMAGE ANALYSIS;
INTERFACES (MATERIALS);
NANOSTRUCTURED MATERIALS;
OPTOELECTRONIC DEVICES;
GRADIENT PATTERN ANALYSIS;
GRADIENT PATTERN ANALYSIS (GPA);
KPZ EQUATION;
SCANNING FORCE MICROSCOPY (SFM);
POROUS SILICON;
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EID: 32544438445
PISSN: 00262692
EISSN: None
Source Type: Journal
DOI: 10.1016/j.mejo.2005.05.029 Document Type: Article |
Times cited : (8)
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References (13)
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