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Solid State Communications

Volumn 113, Issue 12, 2000, Pages 703-708

Characterization of asymmetric fragmentation patterns in SFM images of porous silicon

(5) Ferreira Da Silva, A a Rosa, R R a Roman, L S b Veje, E c,e Pepe, I d

a INSTITUTO NACIONAL DE PESQUISAS ESPACIAIS (Brazil)

b LINKÖPING UNIVERSITY (Sweden)

c UNIVERSITY OF COPENHAGEN (Denmark)

d FEDERAL UNIVERSITY OF BAHIA (Brazil)

e TECHNICAL UNIVERSITY OF DENMARK (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL SYMMETRY; MICROSCOPIC EXAMINATION; SEMICONDUCTING SILICON;

SCANNING FORCE MICROSCOPY (SFM);

POROUS SILICON;

EID: 0242395325 PISSN: 00381098 EISSN: None Source Type: Journal
DOI: 10.1016/S0038-1098(99)00557-8 Document Type: Article

Times cited : (14)

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