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Volumn 41, Issue 11 B, 2002, Pages 6825-6828

Direct crystallization and characterization of Bi3TiTaO 9 thin films prepared by metalorganic chemical vapor deposition

Author keywords

Bi3titao9 thin films; BTT; Dielectric property; Leakage current; Metalorganic chemical vapor deposition (MOCVD)

Indexed keywords

CRYSTALLIZATION; METALLORGANIC CHEMICAL VAPOR DEPOSITION; THERMAL EFFECTS; X RAY DIFFRACTION;

EID: 32444446313     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.41.6825     Document Type: Article
Times cited : (1)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.