Second generation of correction methods in electron probe x-ray microanalysis: Approximation models for emission depth distribution functions

Journal of Analytical Chemistry

Volumn 59, Issue 7, 2004, Pages 600-616

  Lavrent'Ev, Yu G ^a   Korolyuk, V N ^a   Usova, L V ^a  

^a Geophysics   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ACCURACY; ANALYTIC METHOD; CHEMICAL MODIFICATION; ELECTRON PROBE MICROANALYSIS; EXCITATION; FLUORESCENCE ANALYSIS; MATHEMATICAL COMPUTING; MOLECULAR DYNAMICS; MOLECULAR INTERACTION; MOLECULAR MECHANICS; MOLECULAR MODEL; REACTION ANALYSIS; REVIEW; TECHNIQUE; X RAY MICROANALYSIS;

EID: 3242878882     PISSN: 10619348     EISSN: None     Source Type: Journal    
DOI: 10.1023/B:JANC.0000035269.96076.d2     Document Type: Review

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