IntriX: A Numerical Model for Electron Probe Analysis at High Depth Resolution: Part I - Theoretical Description

X-Ray Spectrometry

Volumn 27, Issue 1, 1998, Pages 43-57

  Staub, P F ^a,b  

^a SORBONNE UNIVERSITÉ   (France)

^b CAMECA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

IONIZATION;

DEPTH RESOLUTION; ELECTRON PROBE; ELECTRON PROBE ANALYSIS; ELECTRON-BEAM; HOMOGENEOUS SAMPLES; IONIZATION DISTRIBUTIONS; MACROSCOPIC PARAMETERS; NON-HOMOGENEOUS; NUMERICAL RECONSTRUCTION; PROBE-MODEL;

PROBES;

EID: 0032342466     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1097-4539(199801/02)27:1<43::AID-XRS247>3.0.CO;2-N     Document Type: Article

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