SCOPUS 정보 검색 플랫폼

Surface and Interface Analysis

Volumn 36, Issue 7, 2004, Pages 609-612

X-ray photoelectron microscopic imaging of the chemical bonding state of Si in a rock sample

(3) Seyama, H a Wang, D b Soma, M c

a NATIONAL INSTITUTE FOR ENVIRONMENTAL STUDIES (Japan)

b ULVAC PHI Inc (Japan)

c UNIVERSITY OF SHIZUOKA (Japan)

Author keywords

Imaging; Microscopy; Rock; Silicate mineral; XPS

Indexed keywords

CHEMICAL BONDS; CRYSTAL STRUCTURE; EVAPORATION; GEOCHEMISTRY; IMAGING TECHNIQUES; MICROSCOPIC EXAMINATION; MINERALOGY; ROCKS; VACUUM APPLICATIONS; X RAY PHOTOELECTRON SPECTROSCOPY;

PETROLOGICAL CHEMISTRY; ROCK; SURFACE CHARACTERIZATION;

SILICATE MINERALS;

EID: 3242740182 PISSN: 01422421 EISSN: None Source Type: Journal
DOI: 10.1002/sia.1784 Document Type: Article

Times cited : (25)

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