Atomic force microscopy of fatigue crack growth behavior in the low K region

International Journal of Fatigue

Volumn 26, Issue 11, 2004, Pages 1159-1168

  Sugeta, A ^a   Uematsu, Y ^a   Hashimoto, A ^b   Jono, M ^a  

^a OSAKA UNIVERSITY   (Japan)

^b KOMATSU LTD   (Japan)

Author keywords

3 silicon iron; Atomic force microscopy; Crack deflection; Crack kinking; Dislocations; Fatigue crack growth; Image processing; Slip deformation

Indexed keywords

ALGORITHMS; ATOMIC FORCE MICROSCOPY; CRACK PROPAGATION; CRYSTAL ORIENTATION; DEFORMATION; IMAGE PROCESSING; SCANNING ELECTRON MICROSCOPY;

CRACK DEFLECTION; CRACK KINKING; SLIP DEFORMATION;

FATIGUE OF MATERIALS;

EID: 3242704217     PISSN: 01421123     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijfatigue.2004.04.001     Document Type: Article

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