Afm observation of slip deformation near mode I fatigue crack tip and quantitative analysis using image processing technique

Nihon Kikai Gakkai Ronbunshu, A Hen/Transactions of the Japan Society of Mechanical Engineers, Part A

Volumn 66, Issue 646, 2000, Pages 1157-1164

  Sugeta, Atsushi ^a   Uematsu, Yoshihiko ^a   Tanimoto, Kenji ^a   Ueminami, Keiji ^a   Hashimoto, Akihisa ^a   Jono, Masahiro ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

Atomic force microscope; Crack closure; Fatigue crack growth; Image processing technique; Microscopic observation; Slip deformation

Indexed keywords

EID: 62949202991     PISSN: 03875008     EISSN: None     Source Type: Journal    
DOI: 10.1299/kikaia.66.1157     Document Type: Article

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