Optical properties of CdTe1-xSx (0≤x≤1): Experiment and modeling

Journal of Applied Physics

Volumn 85, Issue 10, 1999, Pages 7418-7425

  Wei, K ^a   Pollak, Fred H ^a   Freeouf, J L ^b   Shvydka, Diana ^c   Compaan, A D ^c  

^a CITY UNIVERSITY OF NEW YORK   (United States)

^b Interface Studies Inc   (United States)

^c UNIVERSITY OF TOLEDO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001540260     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.369372     Document Type: Article

References (36)

1. J. Britt and C. Ferekides, Appl. Phys. Lett. 62, 2851 (1993).
2. H. S. Ullal, K. Zweibel, and B. von Roedera, Proceedings of the 26th IEEE Photovoltaic Specialists Conference (IEEE, Piscataway, 1997), p. 301.
3. M. Cardona, M. Weinstein, and G. A. Wolff, Phys. Rev. 140, A634 (1965).
4. G. D. Jensen, B. E. McCandless, and R. W. Birkmire, Mater. Res. Soc. Symp. Proc. 426, 325 (1996).
5. S. Y. Nunoue, T. Hemmi, and E. Kato, J. Electrochem. Soc. 137, 1248 (1990).
6. K. Ohata, J. Saraie, and T. Tanaka, Jpn. J. Appl. Phys., Part I 12, 1641 (1973).
7. A. D. Compaan, Z. Feng, G. Contreras-Puente, C. Narayanswamy, and A. Fischer, Mater. Res. Soc. Symp. Proc. 426, 367 (1996).
8. T. Holden, P. Ram, F. H. Pollak, J. L. Freeouf, B. X. Yang, and M. C. Tamargo, Phys. Rev. B 56, 4037 (1997).
9. Y. L. Soo, S. Huang, Y. H. Kao, and A. D. Compaan, J. Appl. Phys. 83, 4173 (1998).
10. A. Fischer, Z. Feng, E. Bykov, G. Contreras-Puente, A. Compaan, F. Castille-Alvarado, J. Avendano, and A. Mason, Appl. Phys. Lett. 70, 3239 (1997).
11. A. Fischer, L. Anthony, and A. D. Compaan, Appl. Phys. Lett. 72, 2559 (1998).
12. Landolt-Börnstein in Numerical Data and Functional Relationships in Science and Technology, edited by O. Madelung, M. Schultz, and H. Weiss (Springer, New York, 1982), Vols. 17a and 17b.
13. F. A. Jenkins and H. E. White, Fundamentals of Optics, 3rd ed. (McGraw-Hill, New York, 1957), p. 472.
14. F. H. Pollak, in 1967 International Conference on the II-VI Semiconducting Compounds, edited by D. G. Thomas (V.A. Benjaminn, New York, 1967), p. 552.
15. S. Adachi, T. Kimura, and N. Suzuki, J. Appl. Phys. 74, 3435 (1993).
16. C. C. Kim and S. Sivinathan, J. Appl. Phys. 78, 4003 (1995).
17. D. E. Aspnes, Sol. Energy Mater. Sol. Cells 32, 413 (1994).
18. A. E. Rakhshani, J. Appl. Phys. 81, 7988 (1992).
19. J. L. Martinez, G. Martinez, G. Torres-Delgado, O. Guzman, P. Del Angel, O. Zelaya-Angel, and R. Lozada-Morales, J. Mater. Sci.: Mater. Electron. 8, 403 (1997).
20. S. Adachi, Phys. Rev. B 41, 1003 (1990).
21. See, for example, P. Y. Yu and M. Cardona, Fundamentals of Semiconductors: Physics and Materials Properties (Springer, Berlin, 1995).
22. L. Viña, C. Umbach, M. Cardona, and L. Vodopyanov, Phys. Rev. B 29, 6752 (1984).
23. P. Lautenschlager, S. Logothetidis, L. Viña, and M. Cardona, Phys. Rev. B 32, 3811 (1985).
24. H. Lee, D. Biswas, M. V. Klein, H. Morkoc, D. E. Aspnes, B. D. Choe, J. Kim, and C. O. Griffiths, J. Appl. Phys. 75, 5040 (1994).
25. H. Lee, M. V. Lein, D. E. Aspnes, C. P. Kou, M. Peansky, and M. G. Craford, J. Appl. Phys. 73, 400 (1993).
26. A. Ksendsov, F. H. Pollak, and O. K. Wu, Solid State Commun. 70, 963 (1989).
27. Y. Petroff and M. Balkanski, Phys. Rev. B 3, 3299 (1971).
28. See, for example, M. L. Cohen and J. R. Chelikowsky, Electronic Structure and Optical Properties of Semiconductors, 2nd ed. (Springer, Berlin, 1988).
29. See, for example, M. Cardona, Modulation Spectroscopy (Academic, New York, 1969).
30. See, for example, F. H. Pollak and H. Shen, Mater. Sci. Eng., R. 10, 275 (1993).
31. M. Rohlfing and S. G. Louie, Phys. Rev. Lett. 81, 2312 (1998).
32. S. Albrecht, L. Reining, R. Del Sole, and G. Onida, Phys. Rev. Lett. 80, 4510 (1998).
33. S. G. Louie, private communication.
34. See, for example, L. Malikova, F. H. Pollak, and R. Bhat, J. Electron. Mater. 27, 484 (1998), and references therein.
35. See, for example, F. H. Pollak, in Group III Nitride Semiconductor Compounds, edited by B. Gil (Clarendon, Oxford, 1998), p. 158.
36. S-H. Wei and A. Zunger, Phys. Rev. Lett. 76, 664 (1996).