Compositional intermixing at CdS/Cu(In,Ga)Se 2 rough interface studied by x-ray fluorescence

Journal of Applied Physics

Volumn 91, Issue 10 I, 2002, Pages 6416-6422

  Kim, S ^a   Soo, Y L ^a   Kioseoglou, G ^a   Kao, Y H ^a   Ramanathan, K ^b   Deb, S K ^b  

^a UNIVERSITY AT BUFFALO   (United States)

^b NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANGULAR DEPENDENCE OF X-RAY FLUORESCENCES; CDS; CDS FILMS; CONCENTRATION PROFILES; CU(IN , GA)SE; INTERFACIAL ROUGHNESS; NOMINAL THICKNESS; NONDESTRUCTIVE DETERMINATION; ROUGH INTERFACES; ROUGHNESS PARAMETERS; X RAY FLUORESCENCE;

CADMIUM COMPOUNDS; CADMIUM SULFIDE; HETEROJUNCTIONS;

GALLIUM;

EID: 0037095226     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1471388     Document Type: Article

References (22)

1. R. Magri and A. Zunger, Phys. Rev. B 64, 081305 (2001). prb PRBMDO 0163-1829
2. X. Wu, S. Asher, D. H. Levi, D. E. King, Y. Yan, T. A. Gessert, and P. Sheldon, J. Appl. Phys. 89, 4564 (2001). jap JAPIAU 0021-8979
3. N. D. Browning, E. M. James, K. Kishida, I. Arslan, J. P. Buban, J. A. Zaborac, S. J. Pennycook, Y. Xin, and G. Duscher, Rev. Adv. Mat. Sci. 1, 1 (2000).
4. For a general reference, see, for example, A. Benninghoven, F. G. Rudenauer, and H. W. Werner, Secondary Ion Mass Spectrometry: Basic Concepts, Instrumental Aspects, Applications, and Trends (Wiley, New York, 1987).
5. M. A. Contreras, B. Egaas, K. Ramanathan, J. Hiltner, A. Swartzlander, F. Hasson, and R. Noufi, Prog. Photovoltaics 7, 311 (1999). pro PPHOED 1062-7995
6. A. M. Gaber, J. R. Tuttle, D. S. Albin, M. A. Contreras, R. Noufi, and A. M. Hermann, Appl. Phys. Lett. 65, 198 (1994). apl APPLAB 0003-6951
7. Z. H. Ming, A. Krol, Y. L. Soo, Y. H. Kao, J. S. Park, and K. L. Wang, Phys. Rev. B 47, 16373 (1993). prb PRBMDO 0163-1829
8. Y. L. Soo, S. Huang, Y. H. Kao, and A. D. Compaan, J. Appl. Phys. 83, 4173 (1998). jap JAPIAU 0021-8979
9. Y. Yoneda and T. Horiuchi, Rev. Sci. Instrum. 42, 1069 (1971). rsi RSINAK 0034-6748
10. J. M. Bloch, M. Sansone, F. Rondelez, D. G. Pfeiffer, P. Pincus, M. W. Kim, and P. M. Eisenberger, Phys. Rev. Lett. 54, 1039 (1985). prl PRLTAO 0031-9007
11. P. Wobrauschek, H. Aiginger, G. Owesny, and C. Streli, J. Trace Microprobe Tech. 6, 295 (1988). 8s3 JTMTDE 0733-4680
12. V. Penka and W. Hub, Spectrochim. Acta, Part B 44, 483 (1989). stb SAASBH 0584-8547
13. A. Iida, K. Sakurai, A. Yoshinaga, and Y. Gohshi, Nucl. Instrum. Methods Phys. Res. A 246, 736 (1986). nia NIMAER 0168-9002
14. D. K. G. de Boer, Phys. Rev. B 44, 498 (1991). prb PRBMDO 0163-1829
15. U. Weisbrod, R. Gutschke, J. Knoth, and H. Schwenke, Appl. Phys. A: Solids Surf. 53, 449 (1991). apa APSFDB 0721-7250
16. W. W. van den Hoogenhof and D. K. G. de Boer, Spectrochim. Acta, Part B 48, 277 (1993). stb SAASBH 0584-8547
17. H. Schwenke, R. Gutschke, J. Knoth, and M. Kock, Appl. Phys. A: Solids Surf. 54, 460 (1992). apa APSFDB 0721-7250
18. K. Tsuji, T. Yamada, T. Utaka, and K. Hirokawa, J. Appl. Phys. 78, 969 (1995). jap JAPIAU 0021-8979
19. A. Król, C. J. Sher, and Y. H. Kao, Phys. Rev. B 38, 8579 (1988). prb PRBMDO 0163-1829
20. L. Nevot and P. Croce, Rev. Phys. Appl. 15, 761 (1980). rpa RPHAAN 0035-1687
21. L. G. Parratt, Phys. Rev. 95, 359 (1954). phr PHRVAO 0031-899X
22. L. Nevot, B. Pardo, and J. Corno, Rev. Phys. Appl. 23, 1675 (1988). rpa RPHAAN 0035-1687