SCOPUS 정보 검색 플랫폼

Solid State Communications

Volumn 131, Issue 8, 2004, Pages 523-526

Enhanced strain relaxation induced by epitaxial layer growth mode of MgO thin films

(3) Chen, Tonglai a Li, Xiao Min a Zhang, Sam b

a SHANGHAI INSTITUTE OF CERAMICS (China)

b NANYANG TECHNOLOGICAL UNIVERSITY (Singapore)

Author keywords

A. MgO; A. Thin films; C. Reflection high energy electron diffraction; D. Pulsed laser deposition

Indexed keywords

DISLOCATIONS (CRYSTALS); EPITAXIAL GROWTH; FILM GROWTH; HIGH TEMPERATURE SUPERCONDUCTORS; LATTICE CONSTANTS; PULSED LASER DEPOSITION; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; RELAXATION PROCESSES; SINGLE CRYSTALS; STRAIN; THERMAL EXPANSION; THICKNESS MEASUREMENT; THIN FILMS;

MGO; MISFIT DISLOCATION; ROOM TEMPERATURE; STRAIN RELAXATION;

MAGNESIA;

EID: 3242671600 PISSN: 00381098 EISSN: None Source Type: Journal
DOI: 10.1016/j.ssc.2004.06.016 Document Type: Article

Times cited : (15)

References (15)

1
- 0000541018
- W.J. Kim, W. Chang, S.B. Qadri, J.M. Pond, S.W. Kirchoefer, D.B. Chrisey, J.S. Horwitz, Appl. Phys. Lett. 76 (2002) 1185.
- (2002) Appl. Phys. Lett. , vol.76 , pp. 1185
- Kim, W.J.¹ Chang, W.² Qadri, S.B.³ Pond, J.M.⁴ Kirchoefer, S.W.⁵ Chrisey, D.B.⁶ Horwitz, J.S.⁷

2
- 25744441345
- N.A. Pertsev, A.K. Tagantsev, N. Setter, Phys. Rev. B 35 (2002) 825.
- (2002) Phys. Rev. B , vol.35 , pp. 825
- Pertsev, N.A.¹ Tagantsev, A.K.² Setter, N.³

3
- 79956056412
- T.R. Taylor, P.J. Hansen, B. Acikel, N. Pervez, R.A. York, S.K. Streiffer, J.S. Speck, Appl. Phys. Lett. 80 (2002) 1978.
- (2002) Appl. Phys. Lett. , vol.80 , pp. 1978
- Taylor, T.R.¹ Hansen, P.J.² Acikel, B.³ Pervez, N.⁴ York, R.A.⁵ Streiffer, S.K.⁶ Speck, J.S.⁷

4
- 0001129010
- J.M. Philips, J. Appl. Phys. 79 (1996) 1829.
- (1996) J. Appl. Phys. , vol.79 , pp. 1829
- Philips, J.M.¹

5
- 36449001663
- D.K. Fork, F.A. Ponce, J.C. Tramantana, T.H. Geballe, Appl. Phys. Lett. 58 (1991) 2294.
- (1991) Appl. Phys. Lett. , vol.58 , pp. 2294
- Fork, D.K.¹ Ponce, F.A.² Tramantana, J.C.³ Geballe, T.H.⁴

6
- 14744272723
- T. Zheleva, K. Jagannadham, J. Narayan, J. Appl. Phys. 75 (1994) 860.
- (1994) J. Appl. Phys. , vol.75 , pp. 860
- Zheleva, T.¹ Jagannadham, K.² Narayan, J.³

7
- 0347477190
- L.S-J. Peng, X.X. Xi, B.H. Moeckly, S.P. Alpay, Appl. Phys. Lett. 83 (2003) 4592.
- (2003) Appl. Phys. Lett. , vol.83 , pp. 4592
- Peng, L.S.-J.¹ Xi, X.X.² Moeckly, B.H.³ Alpay, S.P.⁴

8
- 3242717304
- K. Obata, K. Sugioka, H. Takai, K. Midorikawa, Appl. Surf. Sci. 335 (1999) 138.
- (1999) Appl. Surf. Sci. , vol.335 , pp. 138
- Obata, K.¹ Sugioka, K.² Takai, H.³ Midorikawa, K.⁴

9
- 0034140917
- W. Wu, K.H. Wong, C.L. Choy, Thin Solid Films 360 (2000) 103.
- (2000) Thin Solid Films , vol.360 , pp. 103
- Wu, W.¹ Wong, K.H.² Choy, C.L.³

10
- 0030123750
- S. Labdi, P. Houdy, P. Psyllaki, M. Jeandin, Thin Solid Films 275 (1996) 213.
- (1996) Thin Solid Films , vol.275 , pp. 213
- Labdi, S.¹ Houdy, P.² Psyllaki, P.³ Jeandin, M.⁴

11
- 0346955939
- J.W. Matthews, A.E. Blakeslee, J. Cryst. Growth 27 (1974) 118.
- (1974) J. Cryst. Growth , vol.27 , pp. 118
- Matthews, J.W.¹ Blakeslee, A.E.²

12
- 0000589159
- E.J. Tarsa, E.A. Hachfeld, F.T. Quinlan, J.S. Specka, M. Eddy, Appl. Phys. Lett. 68 (1996) 490.
- (1996) Appl. Phys. Lett. , vol.68 , pp. 490
- Tarsa, E.J.¹ Hachfeld, E.A.² Quinlan, F.T.³ Specka, J.S.⁴ Eddy, M.⁵

13
- 0032629370
- C.N.L. Edcardsson, J. Birch, U. Helmersson, J.Mater. Sci.: Mater. Electron 10 (1999) 203.
- (1999) J. Mater. Sci.: Mater. Electron , vol.10 , pp. 203
- Edcardsson, C.N.L.¹ Birch, J.² Helmersson, U.³

14
- 0008411609
- D. Fuchs, M. Adam, P. Schweiss, S. Gerhold, R. Schneider, B. Obst, J. Appl. Phys. 88 (2000) 1844.
- (2000) J. Appl. Phys. , vol.88 , pp. 1844
- Fuchs, D.¹ Adam, M.² Schweiss, P.³ Gerhold, S.⁴ Schneider, R.⁵ Obst, B.⁶

15
- 0003453601
- Springer, New York
- M.J. Gillan, A.B. Lidiard, Computer Simulation of Solids, Springer, New York, 1982, p. 32.
- (1982) Computer Simulation of Solids , pp. 32
- Gillan, M.J.¹ Lidiard, A.B.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.