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Volumn 378, Issue 2, 2004, Pages 232-240

Overcoming spectral overlap in isotopic analysis via single- and multi-collector ICP-mass spectrometry

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION; DEPOSITION; ELECTROLYTES; IONIZATION; ISOTOPES; PRECIPITATION (CHEMICAL); SPECTRUM ANALYSIS;

EID: 3242669585     PISSN: 16182642     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00216-003-2175-8     Document Type: Review
Times cited : (52)

References (58)
  • 3
    • 0004034543 scopus 로고    scopus 로고
    • Thermal ionization mass spectrometry
    • Barshick CM, Duckworth DC, Smith DH (eds). Marcel Dekker, New York
    • Smith DH (2000) Thermal ionization mass spectrometry. In: Barshick CM, Duckworth DC, Smith DH (eds) Inorganic mass spectrometry - fundamentals and applications. Marcel Dekker, New York
    • (2000) Inorganic Mass Spectrometry - Fundamentals and Applications
    • Smith, D.H.1
  • 29
    • 21244478594 scopus 로고    scopus 로고
    • High resolution capability of the Nu Plasma-Nu Plasma iron analysis
    • Nu instruments (2003) High resolution capability of the Nu Plasma-Nu Plasma iron analysis. Nu instruments technical note
    • (2003) Nu Instruments Technical Note
  • 41
    • 21244451933 scopus 로고    scopus 로고
    • Bohme DK (2003) http://www.chem.yorku.ca/profs/bohme/research/research. html
    • (2003)
    • Bohme, D.K.1
  • 58
    • 21244501765 scopus 로고    scopus 로고
    • Spectrom 17:183-188
    • Spectrom , vol.17 , pp. 183-188


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.