Fundamental aspects of ion extraction in inductively coupled plasma mass spectrometry

Spectrochimica Acta - Part B Atomic Spectroscopy

Volumn 51, Issue 8 PART B, 1996, Pages 779-815

  Niu, Hongsen ^a   Houk, R S ^a  

^a IOWA STATE UNIVERSITY   (United States)

Author keywords

Campargue nozzle; Electron density; Electron temperature; ICP MS; Inductively coupled plasma mass spectrometry; Ion deposition; Ion extraction from plasmas; Ion lens; Langmuir probe; Plasma diagnostics; Plasma source mass spectrometry; Skimmer

Indexed keywords

ATMOSPHERIC PRESSURE; CARRIER CONCENTRATION; DEPOSITION; ELECTRIC SPACE CHARGE; ELECTRON LENSES; EXTRACTION; IONS; NOZZLES; PLASMA DIAGNOSTICS; PLASMA JETS; PLASMAS; TEMPERATURE;

COMPARGUE NOZZLE; INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY; ION EXTRACTION FROM PLASMAS; LANGMUIR PROBE; PLASMA SOURCE MASS SPECTROMETRY; SKIMMER; SUPERSONIC BEAM; SUPERSONIC JET;

MASS SPECTROMETRY;

EID: 0030191015     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/0584-8547(96)01506-6     Document Type: Review

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