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Volumn 29, Issue 3, 2004, Pages 33-45

Local mechanical properties determined by atomic force microscopy;Les apports de la microscopie a force atomique pour la caracterisation mecanique locale des surfaces

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CANTILEVER BEAMS; CORROSION RESISTANCE; ELASTIC MODULI; IMAGING SYSTEMS; PASSIVATION; STRESS ANALYSIS;

EID: 3242655604     PISSN: 01519107     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Review
Times cited : (3)

References (34)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.